This example illustrates how to obtain FA, the structure factors of normal
scattering component of the anomalous scatterers. FA can be used for 
determining the anomalous scatterer sites with Patterson or direct methods.

The following logical steps are required:
f2ano: determine Bijvoet pairs of a particular data collection.
anoscl: local scaling to minimize errors in Bijvoet pairs.
wvlscl: local scaling between wavelengths.
madlsq: least-squres solution for FA.
mergit: the merging of independently determined FA.

The output file from the last step contain merged FA for Patterson or
direct methods (in a formatted file or X-plor file).

The most important statistics
Anomalous diffraction ratios:
                       1         2         3         4

         1          .087      .089      .089      .092
                  ( .070)

         2                    .107      .087      .094
                            ( .080)

         3                              .113      .091
                                      ( .083)

         4                                        .111


merging statistics:                           

resolution:      15.00      4.75

 Unique reflections written out in the shell      2130
 There are 13896 pairs of "good" reflections
            R(FZ) =  .032
            R(FA) =  .306
     delta DELPHI = 25.31
     average SPHI = 13.17
 Average FZ for all unique ref's:  421.34
 Average FA for all unique ref's:  129.56

 Resolution:       4.75      3.79

 Unique reflections written out in the shell      2009
 There are 11374 pairs of "good" reflections
            R(FZ) =  .036
            R(FA) =  .408
     delta DELPHI = 38.76
     average SPHI = 17.64
 Average FZ for all unique ref's:  413.26
 Average FA for all unique ref's:  102.83

 Resolution:       3.79      3.31

 Unique reflections written out in the shell      1972
 There are  7074 pairs of "good" reflections
            R(FZ) =  .051
            R(FA) =  .483
     delta DELPHI = 53.72
     average SPHI = 21.34
 Average FZ for all unique ref's:  278.34
 Average FA for all unique ref's:  112.14

 Resolution:       3.31      3.01

 Unique reflections written out in the shell      1962
 There are  4226 pairs of "good" reflections
            R(FZ) =  .077
            R(FA) =  .495
     delta DELPHI = 69.19
     average SPHI = 24.07
 Average FZ for all unique ref's:  197.80
 Average FA for all unique ref's:  127.70
Resolution:       3.01      2.80

 Unique reflections written out in the shell      1944
 There are  2375 pairs of "good" reflections
            R(FZ) =  .101
            R(FA) =  .485
     delta DELPHI = 73.91
     average SPHI = 24.39
 Average FZ for all unique ref's:  150.39
 Average FA for all unique ref's:  151.93



 Summary of data in all shells

 Statistics on multiple "good" measurements:
    For   10017 total unique reflections, there are
         38945 pairs of "good" redundant measurements
               R(FZ) =  .042
               R(FA) =  .388
        delta DELPHI = 42.13
        average SPHI = 17.83
    Delta(DELPHI) > 90 for  2124 unique reflections

 Unique reflections written    :     10017
 Total "good" reflections      :      8051      80.4%
 Having a "worst" problem of
    No phasing by MADLSQ       :       340       3.4%
    FA = 0, FA > input max     :        16        .2%
    SPHI .GT. PHICUT           :       376       3.8%
    QUART .GT. qmax            :       410       4.1%
    FA > ACOF*exp(-BFAC*s**2)  :       417       4.2%
    FZ .le. zcut*SFZ           :        47        .5%
    FA .le. acut*SFA           :       360       3.6%